instrument introduction:
      Dielectric loss and dielectric constant are important physical properties of various metal oxides, plates, ceramics, mica, glass, plastics and other materials. The factors that affect the dielectric loss and dielectric constant can be further understood through the measurement, which provides the basis for improving the properties of materials.

instrument purpose:
      This instrument is used in research institutions, schools, factories and other units to study the properties of new inorganic metal materials.

technical parameters:
1. signal source: DDS digital synthesis 10KHZ-70MHz
2. sampling accuracy: 11bit
3.   qmeasurement range: 1-1000 automatic / manual range  
4. Q resolution: 0.1
5.   Q measurement error 5%
6. Inductance measurement range: resolution 0.1nh 1nh-8.4h, resolution 0.1nh
7.   inductance measurement error 3%
8. Tuning capacitance: main capacitance 30-540pf
9. Direct measurement range of capacitance: 1pf ～ 2.5uf
10. Tuning capacitance error: ± 1pf or < 1% 0.1pf
11.   resonance point search: automatic scanning
12. Q qualified preset range: 5-1000 sound light prompt
13   LCD display parameters: F, l, C, Q, lt, CT band, etc.    
14.   accuracy of dielectric loss coefficient: 1 / 10000
15. Accuracy of dielectric constant: one thousandth
16. Material test thickness: 0.1mm-10 mm

unique technology
1. The instrument automatically deducts residual inductance and test lead inductance. Greatly improve the measurement accuracy.
2. Direct measurement and display of large capacitance value.
3. Digital display micro measuring device, direct reading value.

reference standard:
1. GBT 1409-2006 recommended method for measuring the permittivity and dielectric loss factor of electrical insulating materials under power frequency, audio frequency and high frequency (including meter wave long memory);
2. GBT 1693-2007 test method for dielectric constant and dielectric loss tangent of vulcanized rubber;
3. Astm-d150 - Test Method for dielectric constant.
4. Gb9622.9-88/sjt 11043-1996 test method for high frequency dielectric loss and dielectric constant of electronic glass